FQB7N65CTM

FQB7N65CTM Datasheet


FQB7N65C 650V N-Channel MOSFET

Part Datasheet
FQB7N65CTM FQB7N65CTM FQB7N65CTM (pdf)
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FQB7N65C 650V N-Channel MOSFET

FQB7N65C
650V N-Channel MOSFET
• 7A, 650V, RDS on = = 10 V
• Low gate charge typical 28 nC
• Low Crss typical 12 pF
• Fast switching
• 100% avalanche tested
• Improved dv/dt capability
• RoHS Compliant

October 2008

These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficient switched mode power supplies, active power factor correction, electronic lamp ballast based on half bridge topology.

D2-PAK

FQB Series

Absolute Maximum Ratings

VDSS ID

IDM VGSS EAS IAR EAR dv/dt PD

TJ, TSTG TL

Parameter

Drain-Source Voltage

Drain Current Drain Current
- Continuous TC = 25°C - Continuous TC = 100°C - Pulsed

Gate-Source Voltage

Single Pulsed Avalanche Energy

Avalanche Current

Repetitive Avalanche Energy

Peak Diode Recovery dv/dt

Power Dissipation TC = 25°C - Derate above 25°C

Operating and Storage Temperature Range

Maximum lead temperature for soldering purposes, from case for 5 seconds

Note 1

Note 2 Note 1 Note 1 Note 3

Thermal Characteristics

Parameter

Thermal Resistance, Junction-to-Case Thermal Resistance, Junction-to-Ambient

FQB7N65C
650 7
28 ± 30 212 7 173 -55 to +150 300

FQB7N65C

Units

V A V mJ A mJ V/ns W/°C °C

Units
°C/W °C/W
2008 Fairchild Semiconductor Corporation

FQB7N65C 650V N-Channel MOSFET
Package Marking and Ordering Information

Device Marking

Device

FQB7N65C

FQB7N65CTM

Package

D2-PAK

Reel Size
330mm

Tape Width
24mm

Quantity

Electrical Characteristics TC = 25°C unless otherwise noted

Parameter

Test Conditions

Off Characteristics

BVDSS

IDSS

Drain-Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current

IGSSF

Gate-Body Leakage Current, Forward

IGSSR

On Characteristics

VGS = 0 V, ID = 250 µA

ID = 250 µA, Referenced to 25°C

VDS = 650 V, VGS = 0 V VDS = 520 V, TC = 125°C VGS = 30 V, VDS = 0 V VGS = -30 V, VDS = 0 V

VGS th

Gate Threshold Voltage

RDS on

Static Drain-Source On-Resistance

Forward Transconductance

Dynamic Characteristics

VDS = VGS, ID = 250 µA VGS = 10 V, ID = A VDS = 40 V, ID A

Note 4

Ciss

Input Capacitance

Coss

Output Capacitance

Crss

Switching Characteristics

VDS = 25 V, VGS = 0 V, f = MHz
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Datasheet ID: FQB7N65CTM 515198