FDG6313N Dual N-Channel, Digital FET
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FDG6313N (pdf) |
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April 2002 FDG6313N Dual N-Channel, Digital FET These dual N-Channel logic level enhancement mode field effect transistors are produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process is especially tailored to minimize on-state resistance. This device has been designed especially for low voltage applications as a replacement for bipolar digital transistors and small signal MOSFETs. 25 V, A continuous, A peak. RDS ON = VGS= V, RDS ON VGS= V. Very low level gate drive requirements allowing direct operation in 3 V circuits VGS th < V . Gate-Source Zener for ESD ruggedness >6kV Human Body Model . Compact industry standard SC70-6 surface mount package. SC70-6 SOT-23 SuperSOTTM-6 SuperSOTTM-8 SO-8 SOT-223 S2 G2 D1 SC70-6 D2 G1 S1 1 or 4 * 2 or 5 3 or 6 * The pinouts are symmetrical pin 1 and 4 are interchangeable. Units inside the carrier can be of either orientation and will not affect the functionality of the device. Absolute Maximum Ratings TA = 25°C unless otherwise noted Symbol Parameter VDSS Drain-Source Voltage VGSS Gate-Source Voltage Drain/Output Current - Continuous - Pulsed PD TJ,TSTG ESD Maximum Power Dissipation Note 1 Operating and Storage Temperature Range Electrostatic Discharge Rating MIL-STD-883D Human Body Model 100 pF / 1500 THERMAL CHARACTERISTICS Thermal Resistance, Junction-to-Ambient FDG6313N 25 - to +8 -55 to 150 6 or 3 5 or 2 |
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