MAGX-001214-250L00
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MAGX-001214-SB1PPR (pdf) |
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MAGX-001214-250L00 |
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MAGX-001214-250L00 GaN on SiC HEMT Pulsed Power Transistor 250 W Peak, 1200-1400 MHz, 300 µs Pulse, 10% Duty • GaN on SiC Depletion-Mode Transistor Technology • Internally Matched • Common-Source Configuration • Broadband Class AB Operation • RoHS* Compliant and 260 °C Reflow Compatible • +50 V Typical Operation • MTTF = 600 years TJ < 200 °C • L-Band pulsed radar The MAGX-001214-250L00 is a gold metalized matched Gallium Nitride GaN on Silicon Carbide RF power transistor optimized for pulsed L-Band radar applications. Using state of the art wafer fabrication processes, these high performance transistors provide high gain, efficiency, bandwidth, ruggedness over a wide bandwidth for today’s demanding application needs. High breakdown voltages allow for reliable and stable operation in extreme mismatched load conditions unparalleled with older semiconductor technologies. Ordering Information Part Number MAGX-001214-250L00 250W GaN Power Transistor MAGX-001214-SB1PPR Evaluation Test Fixture Typical RF Performance under Standard Operating Conditions, POUT = 250 W Peak Freq Gain Eff. Droop VSWR-S VSWR-T 10:1 1200 1250 1300 1350 1400 * Restrictions on Hazardous Substances, European Union Directive 2002/95/EC. M/A-COM Technology Solutions Inc. MACOM and its affiliates reserve the right to make changes to the product s or information contained herein without notice. Visit for additional data sheets and product information. For further information and support please visit: MAGX-001214-250L00 GaN on SiC HEMT Pulsed Power Transistor 250 W Peak, 1200-1400 MHz, 300 µs Pulse, 10% Duty Electrical Specifications Freq. = 1200 - 1400 MHz, TA = 25°C Parameter Test Conditions Symbol Min. Typ. Max. Units RF Functional Tests Peak Input Power Power Gain VDD = 50 V, IDQ = 250 mA, Drain Efficiency Pulse Width = 300 us, Duty Cycle = 10%, Load Mismatch Stability POUT = 250 W Peak 25 W avg. VSWR-S 5:1 Load Mismatch Tolerance VSWR-T 10:1 Electrical Characteristics TA = 25°C Parameter Test Conditions DC Characteristics Drain-Source Leakage Current Gate Threshold Voltage Forward Transconductance Dynamic Characteristics |
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