FQA12N60

FQA12N60 Datasheet


FQA12N60

Part Datasheet
FQA12N60 FQA12N60 FQA12N60 (pdf)
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FQA12N60

FQA12N60
600V N-Channel MOSFET

April 2000

QFETTM

These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficiency switch mode power supply.
• 12A, 600V, RDS on = VGS = 10 V
• Low gate charge typical 42 nC
• Low Crss typical 25 pF
• Fast switching
• 100% avalanche tested
• Improved dv/dt capability

TO-3P

FQA Series

Absolute Maximum TC = 25°C unless otherwise noted

Parameter

VDSS ID

IDM VGSS EAS IAR EAR dv/dt

Drain-Source Voltage

Drain Current Drain Current
- Continuous TC = 25°C - Continuous TC = 100°C - Pulsed

Gate-Source Voltage

Single Pulsed Avalanche Energy

Avalanche Current

Repetitive Avalanche Energy

Peak Diode Recovery dv/dt

Note 1

Note 2 Note 1 Note 1 Note 3

TJ, TSTG TL

Power Dissipation TC = 25°C - Derate above 25°C

Operating and Storage Temperature Range Maximum lead temperature for soldering purposes, from case for 5 seconds

FQA12N60 600 12 48 790 12 24 240
-55 to +150

Thermal Characteristics

Parameter Thermal Resistance, Junction-to-Case Thermal Resistance, Case-to-Sink Thermal Resistance, Junction-to-Ambient
2000 Fairchild Semiconductor International

Units V A V mJ A mJ

W/°C °C °C

Units

FQA12N60

Electrical = 25°C unless otherwise noted

Parameter

Test Conditions

Min Typ Max Units

Off Characteristics

BVDSS Drain-Source Breakdown Voltage
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Datasheet ID: FQA12N60 514997