FDG6302P Dual P-Channel, Digital FET
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FDG6302P (pdf) |
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July 1999 FDG6302P Dual P-Channel, Digital FET These dual P-Channel logic level enhancement mode field effect transistors are produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process is especially tailored to minimize on-state resistance. This device has been designed especially for low voltage applications as a replacement for bipolar digital transistors and small signal MOSFETs. -25 V, A continuous, A peak. RDS ON = 10 VGS= V, RDS ON = 13 VGS= V. Very low level gate drive requirements allowing direct operation in 3 V circuits VGS th < V . Gate-Source Zener for ESD ruggedness >6kV Human Body Model . Compact industry standard SC70-6 surface mount package. SC70-6 SOT-23 SuperSOTTM-6 SuperSOTTM-8 SO-8 S2 G2 D1 1 or 4 * 2 or 5 SC70-6 S1 3 or 6 *The pinouts are symmetrical pin 1 and 4 are interchangeable. Units inside the carrier can be of either orientation and will not affect the functionality of the device. Absolute Maximum Ratings TA = 25°C unless otherwise noted Symbol Parameter VDSS Drain-Source Voltage VGSS Gate-Source Voltage Drain/Output Current - Continuous - Pulsed Maximum Power Dissipation Note 1 TJ,TSTG Operating and Storage Temperature Range Electrostatic Discharge Rating MIL-STD-883D Human Body Model 100 pF / 1500 THERMAL CHARACTERISTICS Thermal Resistance, Junction-to-Ambient Note 1 FDG6302P -25 -8 -55 to 150 SOT-223 6 or 3 5 or 2 4 or 1 * Units V A W °C kV °C/W |
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