FDFME2P823ZT Integrated P-Channel MOSFET and Schottky Diode
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FDFME2P823ZT Integrated P-Channel MOSFET and Schottky Diode FDFME2P823ZT July 2010 Integrated P-Channel MOSFET and Schottky Diode -20 V, A, 142 mΩ - Max rDS on = 142 mΩ at VGS = V, ID = A - Max rDS on = 213 mΩ at VGS = V, ID = A - Max rDS on = 331 mΩ at VGS = V, ID = A - Max rDS on = 530 mΩ at VGS = V, ID = A - Low profile mm maximum in the new package MicroFET 1.6x1.6 Thin - Schottky VF < V 1A - Free from halogenated compounds and antimony oxides - HBM ESD protection level > 1600 V Note 3 - RoHS Compliant This device is designed specifically as a single package solution for the battery charge switch in cellular handset and other ultra-portable appliacrions. It features as MOSFET with low on-state resistance and an independently connected low forward voltage schottky diode for minimum condution losses. The MicroFET 1.6x1.6 Thin package offers exceptional thermal performance for it's physical size and is well suited to switching and linear mode applications. - Battery Charging - DC-DC Conversion Pin 1 D NC A A1 NC 2 6K 5G 4S BOTTOM MicroFET 1.6x1.6 Thin MOSFET Maximum Ratings TA = 25 °C unless otherwise noted Symbol VDS VGS VRRM IO TJ, TSTG Parameter Drain to Source Voltage Gate to Source Voltage Drain Current -Continuous -Pulsed TA = 25 °C TA = 25 °C TA = 25 °C Schottky Average Forward Current Operating and Storage Junction Temperature Range Thermal Characteristics Note 1a Note 1a Note 1b Note 4 Ratings -20 ±8 -6 28 1 -55 to +150 Units V V A °C Thermal Resistance, Junction to Ambient Single Operation Note 1a Package Marking and Ordering Information °C/W Device Marking 3T Device FDFME2P823ZT Package MicroFET 1.6x1.6 Thin Reel Size 7 ’’ Tape Width 8 mm Quantity 5000 units FDFME2P823ZT Integrated P-Channel MOSFET and Schottky Diode Electrical Characteristics TJ = 25 °C unless otherwise noted Parameter Test Conditions Min Typ Max Units Off Characteristics BVDSS IDSS IGSS Drain to Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate to Source Leakage Current ID = -250 uA, VGS = 0 V ID = -250 uA, referenced to 25 °C mV/°C VDS = -16 V, VGS = 0 V VGS = ±8 V, VDS = 0 V ±10 On Characteristics VGS th Gate to Source Threshold Voltage Gate to Source Threshold Voltage Temperature Coefficient rDS on Drain to Source On Resistance Forward Transconductance VGS = VDS, ID = -250 uA ID = -250 uA, referenced to 25 °C mV/°C VGS = V, ID = A VGS = V, ID = A VGS = V, ID = A VGS = V, ID = A VGS = V, ID = A, TJ = 125 °C VDS = V, ID = A Dynamic Characteristics Ciss Coss Crss VDS = -10 V, VGS = 0 V, f = 1 MHz Switching Characteristics td on tr td off tf Qg Qgs Qgd Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge Gate to Source Gate Charge Gate to Drain “Miller” Charge VDD = -10 V, ID = -1 A, VGS = V, RGEN = 6 Ω PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT Literature Distribution Center for ON Semiconductor 19521 E. 32nd Pkwy, Aurora, Colorado 80011 USA Phone 303−675−2175 or 800−344−3860 Toll Free USA/Canada Fax 303−675−2176 or 800−344−3867 Toll Free USA/Canada Email: Semiconductor Components Industries, LLC N. 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