74F10SJ

74F10SJ Datasheet

74F10 Triple 3-Input NAND Gate

Part	Datasheet
74F10SJ	74F10SJ (pdf)

Related Parts	Information
74F10SJX	74F10SJX
74F10SC	74F10SC
74F10SCX	74F10SCX

PDF Datasheet Preview
74F10 Triple 3-Input NAND Gate 74F10 Triple 3-Input NAND Gate This device contains three independent gates, each of which performs the logic NAND function. May 2007 Ordering Information Order Number 74F10SC 74F10SJ Package Number M14A M14D Package Description 14-Lead Small Outline Integrated Circuit SOIC , JEDEC MS-012, Narrow 14-Lead Small Outline Package SOP , EIAJ TYPE II, 5.3mm Wide Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering number. Connection Diagram Logic Symbol IEEE/IEC Unit Loading/Fan Out Pin Names An, Bn, Cn On Description Inputs Outputs U.L. HIGH/LOW / 50 / Input IIH/IIL, Output IOH/IOL 20µA / / 20mA 74F10 Triple 3-Input NAND Gate Absolute Maximum Ratings Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only. TSTG TA TJ VCC VIN IIN VO Parameter Storage Temperature Ambient Temperature Under Bias Junction Temperature Under Bias VCC Pin Potential to Ground Pin Input Voltage 1 Input Current 1 Voltage Applied to Output in HIGH State with VCC = 0V Standard Output 3-STATE Output Current Applied to Output in LOW State Max. Note Either voltage limit or current limit is sufficient to protect inputs. Rating to +150°C to +125°C to +150°C to +7.0V to +7.0V to +5.0mA to VCC to 5.5V twice the rated IOL mA Recommended Operating Conditions The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recommend exceeding them or designing to absolute maximum ratings. Symbol TA VCC Parameter Free Air Ambient Temperature Supply Voltage Rating 0°C to +70°C +4.5V to +5.5V 1988 Fairchild Semiconductor Corporation 74F10 Triple 3-Input NAND Gate DC Electrical Characteristics Parameter VIH Input HIGH Voltage VIL Input LOW Voltage VCD Input Clamp Diode Voltage VOH Output HIGH Voltage 10% VCC 5% VCC VOL Output LOW Voltage 10% VCC IIH Input HIGH Current IBVI Input HIGH Current Breakdown Test ICEX Output HIGH Leakage Current VID Input Leakage Test IOD Output Leakage Circuit Current IIL IOS ICCH ICCL Input LOW Current Output Short-Circuit Current Power Supply Current Power Supply Current Conditions

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74F10 Triple 3-Input NAND Gate
74F10 Triple 3-Input NAND Gate

This device contains three independent gates, each of which performs the logic NAND function.

May 2007
Ordering Information

Order Number
74F10SC 74F10SJ

Package Number

M14A M14D

Package Description 14-Lead Small Outline Integrated Circuit SOIC , JEDEC MS-012, Narrow 14-Lead Small Outline Package SOP , EIAJ TYPE II, 5.3mm Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering number.

Connection Diagram

Logic Symbol

IEEE/IEC

Unit Loading/Fan Out

Pin Names An, Bn, Cn On

Description Inputs Outputs

U.L. HIGH/LOW
/ 50 /

Input IIH/IIL, Output IOH/IOL 20µA /
/ 20mA
74F10 Triple 3-Input NAND Gate

Absolute Maximum Ratings

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only.

TSTG TA TJ VCC VIN IIN VO

Parameter Storage Temperature Ambient Temperature Under Bias Junction Temperature Under Bias VCC Pin Potential to Ground Pin Input Voltage 1 Input Current 1 Voltage Applied to Output in HIGH State with VCC = 0V

Standard Output 3-STATE Output Current Applied to Output in LOW State Max.

Note Either voltage limit or current limit is sufficient to protect inputs.

Rating to +150°C to +125°C to +150°C
to +7.0V to +7.0V to +5.0mA
to VCC to 5.5V twice the rated IOL mA

Recommended Operating Conditions

The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recommend exceeding them or designing to absolute maximum ratings.

Symbol TA VCC

Parameter Free Air Ambient Temperature Supply Voltage

Rating 0°C to +70°C
+4.5V to +5.5V
1988 Fairchild Semiconductor Corporation
74F10 Triple 3-Input NAND Gate

DC Electrical Characteristics

Parameter

VIH Input HIGH Voltage

VIL Input LOW Voltage

VCD Input Clamp Diode Voltage VOH Output HIGH Voltage 10% VCC
5% VCC VOL Output LOW Voltage 10% VCC IIH Input HIGH Current IBVI Input HIGH Current Breakdown

Test

ICEX Output HIGH Leakage Current VID Input Leakage Test

IOD Output Leakage Circuit Current

IIL IOS ICCH ICCL

Input LOW Current Output Short-Circuit Current Power Supply Current Power Supply Current

Conditions

More datasheets: HF539/34SF | HF539/34 | HF539/64 | HF539/10 | HF539/26 | HF539/14 | 2934 | 1475 | 3180 | 74F10SJX

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Datasheet ID: 74F10SJ 513262