The e1467D is an integrated circuit in CMOS Silicon Gate Technology for analog clocks. It consists of a 32-kHz oscillator, frequency divider, output pulse formers, push-pull motor drivers and alarm output. Integrated capacitors are mask-selectable to accomodate the external quartz crystal. Additional capacitance can be selected through pad bonding to trimming the oscillator frequency.
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E1467DE2-DIT (pdf) |
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• 32-kHz Voltage Regulated Oscillator • V to V Operating-voltage Range • Integrated Capacitors for Digital Trimming • Suitable for up to pF Quartz • Trimming Inputs Insenitive to Stray Capacitance • Output Pulse Formers • Mask Options for Motor Period and Pulse Width • Low Resistance Output for Bipolar Stepping Motor • Motor Fast-test Function The e1467D is an integrated circuit in CMOS Silicon Gate Technology for analog clocks. It consists of a 32-kHz oscillator, frequency divider, output pulse formers, push-pull motor drivers and alarm output. Integrated capacitors are mask-selectable to accomodate the external quartz crystal. Additional capacitance can be selected through pad bonding to trimming the oscillator frequency. 32-kHz Clock CMOS IC with Digital Trimming and Alarm e1467D Pad Configuration Figure Pad Configuration SC4 SC3 SC2 SC1 VDD 1 VSS 1 13 12 11 10 2 9 OSCIN 8 OSCOUT 1 ALIN / MTEST 2 MOT1L 2 e1467D 7 ALOUT 6 MOT2 5 MOT1R 1 The pads VDD and OSCOUT are interchangeable per mask option 2 The pads for ALIN/-MTEST and MOT1L are interchangeable per mask option Pin Description Name VDD VSS OSCIN OSCOUT MOT1/2 ALIN ALOUT SC1 SC4 Description Positive supply voltage Negative supply voltage Oscillator input Oscillator output Motor drive outputs Alarm input Alarm output Oscillator trimming inputs 2 e1467D e1467D Functional Descripion Oscillator Motor Drive Output Alarm Outputs Alarm Input Test Functions An oscillator inverter with feedback resistor is provided to generate the 32768 Hz clock frequency. Values for the fixed capacitors at OSCIN and OSCOUT are mask-selectable see note 3 of “Operating Characteristics” . Four control inputs, SC1 to SC4, enable the users to add integrated trimming capacitors to OSCIN and OSCOUT, providing 15 tuning steps. A frequency variation of typically 4 ppm for each tuning step is obtained by bonding the capacitor pads to OSCIN. As none of these pads are bonded, the IC is in an untrimmed state. Figure 2 shows the trimming curve characteristic. Note For applications which utilize this integrated trimming feature, Atmel will determine optimum val- ues for the integrated capacitors COSCIN and COSCOUT. The e1467D contains two push-pull output buffers for driving bipolar stepping motors. During a motor pulse, the N-channel device of one buffer and the P-channel device of the other buffer will be activated. Both N-channel transistors are on and conducting between output pulses. The outputs are protected against inductive voltage spikes with diodes to both supply pins. The motor output period and pulse width are mask-programmable, as listed below: Available motor periods TM 125, 250, 500 ms and 2, 16 s Available maximum pulse widths tM 15, 6, ms Available motor periods for motor test TMT 250, 500 ms and 1 s Note The following constraints for combination of motor period and pulse widths have to be consid- ered TM > 4 tM, TMT > 4 tM or alternatively TM = 2 tM, TMT = 2 tM The alarm output driver consists of a push-pull stage for driving a speaker via an external bipolar transistor. The output is configured for NPN and PNP bipolar capability. The output is an alarm tone, modulated by a low frequency. Tone frequencies, modulation frequencies, and on/off times are selectable via the metal mask option. A debounced alarm input is provided. Alarm activation is connected either to VDD or VSS by a mask option. For test purposes, the TEST pad is open. With a high resistance probe R 10 MW, C 20 pF , a test frequency fTEST of 128 Hz can be measured at the ALIN/MTEST pad. Connecting ALIN/MTEST for at least 32 ms to the opposite polarity for alarm activation changes the motor period from the selected value to TMT mask-selectable while the pulse width remains unaffected. This feature can be used for testing the mechanical parts of the clock. Figure Functional Test SC4 SC3 SC2 SC1 Ordering Information Table Option List e1467D Motor Option Cycle Pulse Test Frequency Modulation TM TMT Frequency 2 250 2048 2 250 2048 2048 2 250 2048 Note On-chip stray capacitance included Alarm On/off Time Load Cap. Driver Type NPN Activation Polarity VSS VDD VSS pF 10 Integrated Capacitance COSCIN 1 COSCOUT 1 Option Pad 1 -B OSCIN Pad 2 Pad 3 Pad 4 VDD ALOUT MOT2 -D OSCIN OSCOUT ALOUT MOT2 -V2 OSCIN VDD ALOUT MOT2 -D OSCIN OSCOUT ALOUT MOT2 Pad 5 MOT1 Pad Designation Pad 6 Pad 7 Pad 8 MOT1 ALIN/ MTEST MOT1 ALIN/ MTEST MOT1 ALIN/ MTEST ALIN/ TEST MOT1 Pad 9 Pad 10 Pad 11 Pad 12 Pad 13 OSCOUT SC4 SC3 SC2 SC1 SC4 SC3 SC2 SC1 OSCOUT SC4 SC3 SC2 SC1 |
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