HUFA76619D3ST

HUFA76619D3ST Datasheet


HUFA76619D3, HUFA76619D3S

Part Datasheet
HUFA76619D3ST HUFA76619D3ST HUFA76619D3ST (pdf)
Related Parts Information
HUFA76619D3 HUFA76619D3 HUFA76619D3
HUFA76619D3S HUFA76619D3S HUFA76619D3S
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Data Sheet

HUFA76619D3, HUFA76619D3S

January 2002
18A, 100V, Ohm, N-Channel, Logic Level Power MOSFET

Packaging

JEDEC TO-251AA

JEDEC TO-252AA

DRAIN FLANGE

SOURCE DRAIN GATE

HUFA76619D3

DRAIN FLANGE

GATE SOURCE

HUFA76619D3S
• Ultra Low On-Resistance - rDS ON = VGS = 10V - rDS ON = VGS = 5V
• Simulation Models - Temperature Compensated and SABER Electrical Models - Spice and SABER Thermal Impedance Models -
• Peak Current vs Pulse Width Curve
• UIS Rating Curve
• Switching Time vs RGS Curves
Ordering Information

PACKAGE

BRAND

HUFA76619D3

TO-251AA
76619D

HUFA76619D3S

TO-252AA
76619D
NOTE When ordering, use the entire part number. Add the suffix T to obtain the TO-252AA variant in tape and reel, e.g., HUFA76619D3ST.

Absolute Maximum Ratings TC = 25oC, Unless Otherwise Specified

HUFA76619D3, HUFA76619D3S

UNITS

Drain to Source Voltage Note VDSS

Drain to Gate Voltage RGS = Note 1 VDGR

Gate to Source Voltage VGS
±16

Drain Current

Continuous
1220550ooCCoC,, ,VVVGGGSSS===1505VVV

Figure 2
18 12

Continuous TC = 100oC, VGS = 4.5V Figure 2 ID

Pulsed Drain Current IDM

Figure 4

Pulsed Avalanche Rating UIS

Figures 6, 17, 18

Power Dissipation Derate Above 25oC

Operating and Storage Temperature. TJ, TSTG Maximum Temperature for Soldering

Leads at 0.063in 1.6mm from Case for 10s. TL Package Body for 10s, See Techbrief TB334. Tpkg NOTES TJ = 25oC to 150oC.
75 -55 to 175
300 260

W/oC

CAUTION Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.

This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a copy of the requirements, see AEC Q101 at:

Reliability data can be found at All Fairchild semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems certification.
2002 Fairchild Semiconductor Corporation

HUFA76619D3, HUFA76619D3S

Electrical Specifications TC = 25oC, Unless Otherwise Specified

PARAMETER

TEST CONDITIONS

OFF STATE SPECIFICATIONS

Drain to Source Breakdown Voltage

Zero Gate Voltage Drain Current

Gate to Source Leakage Current ON STATE SPECIFICATIONS

BVDSS IDSS IGSS

ID = 250µA, VGS = 0V Figure 12 ID = 250µA, VGS = 0V , TC = -40oC Figure 12

VDS = 95V, VGS = 0V VDS = 90V, VGS = 0V, TC = 150oC

VGS = ±16V

Gate to Source Threshold Voltage Drain to Source On Resistance
More datasheets: PEB 3342 HT V2.2 | PEB 3332 HT V2.2 | PEB 3331 HT V2.2 | PEB 3320 HT V2.2 | PEB 3341 F V2.1 | PEB 3341 F V2.2 | PEB 33322 EL V2.2-G | PEB 3331 HT V2.1 | HUFA76619D3 | HUFA76619D3S


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Datasheet ID: HUFA76619D3ST 634016