FQPF5N50CFTU

FQPF5N50CFTU Datasheet


FQPF5N50CF 500V N-Channel MOSFET

Part Datasheet
FQPF5N50CFTU FQPF5N50CFTU FQPF5N50CFTU (pdf)
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FQPF5N50CF 500V N-Channel MOSFET

FQPF5N50CF
500V N-Channel MOSFET
• 5A, 500V, RDS on = = 10 V
• Low gate charge typical 18nC
• Low Crss typical 15pF
• Fast switching
• 100% avalanche tested
• Improved dv/dt capability

FRFET TM

These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficiency switched mode power supplies, active power factor correction, electronic lamp ballasts based on half bridge topology.

TO-220F

FQPF Series

Absolute Maximum Ratings

Parameter

VDSS

Drain-Source Voltage

IDM VGSS EAS IAR EAR dv/dt

Drain Current Drain Current
- Continuous TC = 25°C - Continuous TC = 100°C - Pulsed

Gate-Source Voltage

Single Pulsed Avalanche Energy

Avalanche Current

Repetitive Avalanche Energy

Peak Diode Recovery dv/dt

Note 1

Note 2 Note 1 Note 1 Note 3

Power Dissipation TC = 25°C
- Derate above 25°C

TJ, TSTG TL

Operating and Storage Temperature Range

Maximum lead temperature for soldering purposes, 1/8" from case for 5 seconds

Thermal Characteristics

Parameter

Thermal Resistance, Junction-to-Case Thermal Resistance, Case-to-Sink Typ. Thermal Resistance, Junction-to-Ambient
● ●

FQPF5N50CF
500 5 20
± 30 300
5 38 -55 to +150 300

FQPF5N50CF

Units

V A V mJ A mJ V/ns W/°C °C °C

Units
°C/W °C/W °C/W
2005 Fairchild Semiconductor Corporation
Package Marking and Ordering Information

Device Marking

FQPF5N50CF

Device

FQPF5N50CF

Package

TO-220F

Reel Size

Tape Width

Quantity

Electrical Characteristics TC = 25°C unless otherwise noted

Parameter

Test Conditions

Min. Typ. Max. Units

Off Characteristics

BVDSS

Drain-Source Breakdown Voltage

VGS = 0 V, ID = 250 µA

Breakdown Voltage Temperature Coef- ID = 250 µA, Referenced to 25°C
ficient

IDSS

Zero Gate Voltage Drain Current

VDS = 500 V, VGS = 0 V

VDS = 400 V, TC = 125°C

IGSSF

Gate-Body Leakage Current, Forward VGS = 30 V, VDS = 0 V

IGSSR

On Characteristics

VGS th RDS on

Gate Threshold Voltage

Static Drain-Source On-Resistance

Forward Transconductance

VDS = VGS, ID = 250 µA

VGS = 10 V, ID = 2.5A

VDS = 40 V, ID = 2.5A

Note 4

Dynamic Characteristics

Ciss Coss

Input Capacitance Output Capacitance

VDS = 25 V, VGS = 0 V,
f = MHz
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Datasheet ID: FQPF5N50CFTU 515433