FQB17N08L / FQI17N08L
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FQI17N08LTU (pdf) |
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FQB17N08LTM |
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FQB17N08L / FQI17N08L FQB17N08L / FQI17N08L 80V LOGIC N-Channel MOSFET December 2000 QFETTM These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology. This advanced technology is especially tailored to minimize on-state resistance, provide superior switching performance, and withstand a high energy pulse in the avalanche and commutation modes. These devices are well suited for low voltage applications such as automotive, high efficiency switching for DC/DC converters, and DC motor control. • 16.5A, 80V, RDS on = = 10 V • Low gate charge typical nC • Low Crss typical 29 pF • Fast switching • 100% avalanche tested • Improved dv/dt capability • 175°C maximum junction temperature rating • Low level gate drive requirements allowing direct operation from logic drives D2-PAK FQB Series I2-PAK FQI Series Absolute Maximum Ratings TC = 25°C unless otherwise noted Symbol VDSS ID IDM VGSS EAS IAR EAR dv/dt PD TJ, TSTG TL Parameter Drain-Source Voltage Drain Current - Continuous TC = 25°C - Continuous TC = 100°C Drain Current - Pulsed Note 1 Gate-Source Voltage Single Pulsed Avalanche Energy Note 2 Avalanche Current Note 1 Repetitive Avalanche Energy Note 1 Peak Diode Recovery dv/dt Note 3 Power Dissipation TA = 25°C * Power Dissipation TC = 25°C - Derate above 25°C Operating and Storage Temperature Range Maximum lead temperature for soldering purposes, 1/8” from case for 5 seconds FQB17N08L / FQI17N08L 80 66 ± 20 100 65 -55 to +175 Units V A V mJ A mJ V/ns W W/°C °C Thermal Characteristics |
More datasheets: HDSP-C2E3 | HDSP-C2L3 | HDSP-C2G3 | HDSP-C2E1 | HDSP-C2G1 | HDSP-C2Y1 | 3498 | VG-1201CA 30.7200M-FBNC3 | VG-1201CA 27.0000M-TANC3 | FQB17N08LTM |
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