IXFJ 40N30
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IXFJ40N30Q (pdf) |
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HiPerFETTM Power MOSFETs N-Channel Enhancement Mode High dv/dt, Low trr, HDMOSTM Family Preliminary data sheet IXFJ 40N30 VDSS = 300 V ID25 = 40 A RDS on = 80 mW trr < 200 ns Symbol VDSS VDGR VGS V ID25 IDM IAR EAR dv/dt PD TJ TJM Tstg TL Weight V DSS VGS th IGSS I RDS on Test Conditions TJ = 25°C to 150°C TJ = 25°C to 150°C RGS = 1 MW Continuous Transient TC = 25°C TC = 25°C, pulse width limited by TJM TC = 25°C TC = 25°C IS IDM, di/dt 100 A/ms, VDD VDSS, TJ 150°C, RG = 2 W TC = 25°C mm in. from case for 10 s Maximum Ratings ±20 ±30 5 V/ns -55 +150 -55 +150 Test Conditions Characteristic Values TJ = 25°C, unless otherwise specified min. typ. max. VDS = VGS, ID = 4 mA VGS = ±20 VDC, VDS = 0 V = • V VGS = 0 V 25°C TJ = 125°C VGS = 10 V, ID = ID25 Pulse test, t 300 ms, duty cycle d 2 % ±100 nA 200 mA 1 mA 80 mW G = Gate, S = Source, D = Drain, TAB = Drain • Low profile, high power package • Long creep and strike distances • Easy up-grade path for TO-220 designs • Low R HDMOSTM process DS on Rugged polysilicon gate |
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