AP1661A
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AP1661AP-G1 (pdf) |
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Preliminary Datasheet HIGH PERFORMANCE POWER FACTOR CORRECTOR AP1661A The AP1661A is an active power factor control IC which is designed mainly for use as pre-converter in electronic ballast, AC-DC adapters and off-line SMPS applications. The AP1661A includes an internal start-up timer for stand-alone applications, a one-quadrant multiplier to realize near unity power factor and a zero current detector to ensure DCM boundary conduction operation. The totem pole output stage is capable of driving power MOSFET with 600mA source current and 800mA sink current. Designed with advanced BiCMOS process, the AP1661A features low start-up current, low operation current and low power dissipation. The AP1661A also has rich protection features including over-voltage protection, input under-voltage lockout with hysteresis and multiplier output clamp to limit maximum peak current. The AP1661A meets IEC61000-3-2 standard even at one-quadrant load and its THD is lower than 10% at high-end line voltage and full load. • Comply with IEC61000-3-2 Standard • Proprietary Design for Minimum THD • Zero Current Detection Control for DCM Bound- ary Conduction Mode • Adjustable Output Voltage with Precise Over- Voltage Protection • Ultra-low Startup Current 30µA Typical • Low Quiescent Current 2.5mA Typical • Precision Internal Reference Voltage 1% • Internal Startup Timer • Disable Function for Reduced Current Consumption • Totem Pole Output with 600mA Source Current and 800mA Sink Current Capability • Under-voltage Lockout with 2.5V of Hysteresis • AC-DC Adapter • Off-line SMPS • Electronic Ballast This IC is available in SOIC-8 and DIP-8 packages. SOIC-8 DIP-8 Figure Package Types of AP1661A BCD Semiconductor Manufacturing Limited HIGH PERFORMANCE POWER FACTOR CORRECTOR Pin Configuration Preliminary Datasheet AP1661A M Package SOIC-8 INV 1 COMP 2 MULT 3 8 VCC 7 GD 6 GND 5 ZCD P Package DIP-8 INV 1 COMP 2 MULT 3 8 VCC 7 GD 6 GND 5 ZCD Figure Pin Configuration of AP1661A Top View Pin Description Pin Number 1 2 3 4 Pin Name INV COMP MULT GND GD VCC Function Inverting input of the error amplifier Output of the error amplifier Input of the multiplier Input of the current control loop comparator Zero current detection input. If it is connected to GND, the device is disabled Ground. Current return for gate driver and control circuits of the IC Gate driver output Supply voltage of gate driver and control circuits of the IC BCD Semiconductor Manufacturing Limited 2 HIGH PERFORMANCE POWER FACTOR CORRECTOR Functional Block Diagram Preliminary Datasheet AP1661A 2.5V COMP MULT Multiplier Voltage Regulation Over Voltage Detection Internal R1 Supply 7V Ordering Information AP1661A Circuit Type Package M SOIC-8 P DIP-8 G1 Green TR Tape and Reel Blank Tube Package SOIC-8 DIP-8 Temperature Range -40 to 85oC -40 to 85oC Part Number AP1661AM-G1 AP1661AMTR-G1 AP1661AP-G1 Marking ID 1661AM-G1 1661AM-G1 AP1661AP-G1 Packing Type Tube Tape & Reel Tube BCD Semiconductor's Pb-free products, as designated with "G1" suffix in the part number, are RoHS compliant and green. BCD Semiconductor Manufacturing Limited 3 Preliminary Datasheet HIGH PERFORMANCE POWER FACTOR CORRECTOR Absolute Maximum Ratings Note 1 AP1661A Parameter Power Supply Voltage Operating Supply Current Driver Output Current Input/Output of Error Amplifier, Input of Multiplier Current Sense Input VCC ICC IOUT VINV, VCOMP, VMULT VCS Zero Current Detector Input IZCD Thermal Resistance Junction-Ambient Power Dissipation and Thermal Characteristics TA=50oC Operating Junction Temperature Storage Temperature Range Lead Temperature Soldering, 10 Seconds ESD Human Body Model ESD Machine Model PTOT TJ TSTG TLEAD Value 20 30 ±800 Source Sink DIP-8 SOIC-8 DIP-8 SOIC-8 -40 to150 -65 to 150 3000 300 Unit V mA V oC/W Note 1 Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "Recommended Operating Conditions" is not implied. Exposure to "Absolute Maximum Ratings" for extended periods may affect device reliability. |
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